ADVANCEMENTS, CHALLENGES, AND FUTURE PERSPECTIVES OF THIN-FILM DEPOSITION ON SILICON
Keywords:
Silicon, Cadmium Sulfide (CdS), Thin Film Deposition, Radial p–n Junction, Heterojunction, Photovoltaics, Efficiency EnhancementAbstract
Silicon’s intrinsic limitations—low optical absorption (α ≈ 10³–10⁴ cm⁻¹), narrow bandgap (1.12 eV), and high surface recombination (S ≈ 10⁴–10⁶ cm·s⁻¹)—restrict device performance. This study demonstrates the deposition of CdS thin films (100–300 nm) on p-type Si to form n–p heterojunctions and radial p–n structures. Characterization using XRD, SEM, and EDS confirmed uniform, high-crystallinity films. Electrical measurements show a 90–95% reduction in surface recombination velocity, a 25–35% increase in short-circuit current density, and 18–22% higher open-circuit voltage. Radial junctions further enhanced carrier collection by 30–40%, yielding an overall 20–30% increase in efficiency, highlighting CdS/Si radial heterostructures as promising for photodetectors and photovoltaics.
References
Livingstone, F. M., De La Rue, R. M., & Duncan, W. (1978). pSi–nCdS heterojunction photodetectors. Physica Status Solidi (a), 46(2), 547–556. https://doi.org/10.1002/pssa.2210460224
Z. Arefinia, A. Asgari, Solar Energy Materials and Solar Cells, 137, 146 (2015). https://doi.org/10.1016/j.solmat.2015.01.032
Abdullayev, J. S., Sapaev, I. B., Kadirov, S. R., & Abdullayev, J. Sh. (2025). Modeling of optoelectronic properties in pSi/n-CdmZn₁₋ₘS heterojunctions: Effects of composition and temperature. Journal of Electronic Materials, 54(10), 1-11. https://doi.org/10.1007/s11664-025-12480-8
O.V. Pylypova, A.A. Evtukh, P.V. Parfenyuk, I.I. Ivanov, I.M. Korobchuk, O.O. Havryliuk, and O.Yu. Semchuk, Opto-Electronics Review, 27(2), 143 (2019). https://doi.org/10.1016/j.opelre.2019.05.003
Dzhafarov, T. D., Ongul, F., & Aydin Yuksel, S. (2009). Effect of indium diffusion on characteristics of CdS films and n-CdS/p-Si heterojunctions. Vacuum, 84(2), 310–314. https://doi.org/10.1016/j.vacuum.2009.06.061
D.H.K. Murthy, T. Xu, W.H. Chen, A.J. Houtepen, T.J. Savenije, L.D.A. Siebbeles, et al., Nanotechnology, 22(31), 315710 (2011). https://doi.org/10.1088/0957-4484/22/31/315710
B. Pal, K.J. Sarkar, and P. Banerji, Solar Energy Materials and Solar Cells, 204, 110217 (2020). https://doi.org/10.1016/j.solmat.2019.110217
I. Aberg, G. Vescovi, D. Asoli, U. Naseem, J.P. Gilboy, C. Sundvall, and L. Samuelson, IEEE Journal of Photovoltaics, 6(1), 185 (2016). https://doi.org/10.1109/JPHOTOV.2015.2484967
P. Dubey, B. Kaushik, and E. Simoen, IET Circuits, Devices & Systems, (2019). https://doi.org/10.1049/iet-cds.2018.5169
M.-D. Ko, T. Rim, K. Kim, M. Meyyappan, and C.-K. Baek, Scientific Reports, 5(1), 11646 (2015). https://doi.org/10.1038/srep11646.
A.M. de Souza, D.R. Celino, R. Ragi, and M.A. Romero, Microelectronics J. 119, 105324 (2021). https://doi.org/10.1016/j.mejo.2021.105324.
J.Sh. Abdullayev, I.B. Sapaev,. (2024). Optimization of The Influence of Temperature on The Electrical Distribution of Structures with Radial p-n Junction Structures. East European Journal of Physics, (3), 344-349. https://doi.org/10.26565/2312-4334-2024-3-39.
J.Sh. Abdullayev, I.B. Sapaev, (2024). Оптимизация влияния легирования и температуры на электрофизические характеристики p-n и p-i-n переходных структур. Eurasian Physical Technical Journal, 21(3(49), 21–28. (https://doi.org/10.31489/2024No3/21-28).
J.Sh. Abdullayev, Influence of Linear Doping Profiles on the Electrophysical Features of p-n Junctions // East European Journal of Physics, (1), 245-249. (https://doi.org/10.26565/2312-4334-2025-1-26).
R. Ragi, R.V.T. da Nobrega, U.R. Duarte, and M.A. Romero, IEEE Trans. Nanotechnol. 15(4), 627 (2016). https://doi.org/10.1109/TNANO.2016.2567323.
J.Sh. Abdullayev, I.B. Sapaev, Modeling and calibration of electrical features of p-n junctions based on Si and GaAs // Physical Sciences and Technology (Phys. sci. technol). Vol.11, no. 3-4, pp. 39–48, 2024, (https://doi.org/10.26577/phst2024v11i2b05).
R.D. Trevisoli, R.T. Doria, M. de Souza, S. Das, I. Ferain, and M.A. Pavanello, IEEE Trans. Electron Devices, 59(12), 3510 (2012). https://doi.org/10.1109/TED.2012.2219055.
Rustamova, D. F., Mehdiyeva, A. M., Mahmudova, Z. A., Abdullaev, J.Sh., & Sapaev, B. (2025). Web of Conferences, 151, 03006. https://doi.org/10.1051/bioconf/202515103006
J.Sh. Abdullayev, I.B. Sapaev, (2024). Factors Influencing the Ideality Factor of Semiconductor p-n and p-i-n Junction Structures at Cryogenic Temperatures. East European Journal of Physics, (4), 329-333. https://doi.org/10.26565/2312-4334-2024-4-37
A.V. Babichev, H. Zhang, P. Lavenus, F.H. Julien, A.Y. Egorov, Y.T. Lin, and M. Tchernycheva, Applied Physics Letters, 103(20), 201103 (2013). https://doi.org/10.1063/1.4829756.
J. Sh. Abdullayev, I. B. Sapaev, Kh. N. Juraev, Theoretical analysis of incomplete ionization on the electrical behavior of radial p-n junction structures, Low Temp. Phys. 51, 60–64 (2025), (https://doi.org/10.1063/10.0034646).
J.Sh. Abdullayev, I.B. Sapaev, East European Journal of Physics, no. 1, pp. 204-210. 2025, (https://doi.org/10.26565/2312-4334-2025-1-21).
J.Sh. Abdullayev, Influence of Linear Doping Profiles on the Electrophysical Features of p-n Junctions, East European Journal of Physics, no. 1, pp. 245-249, 2025, (https://doi.org/10.26565/2312-4334-2025-1-26).
J.Sh. Abdullayev, Sapaev, I., Esanmuradova, N., Kadirov, S., & Kuliyev, Mathematical Analysis of the Features of Radial p-n Junction: Influence of Temperature and Concentration, East European Journal of Physics, no. 2, pp. 220-225, 2025. (https://doi.org/10.26565/2312-4334-2025-2-24).
J.Sh. Abdullayev, Sapaev, I. B., & Kadirov, S. R., The Role of Recombination Types in Efficiency Limits of Radial p n junctions based on Si and GaAs, East European Journal of Physics, no. 2, pp. 252-257, 2025, (https://doi.org/10.26565/2312-4334-2025-2-30).
I. Sapaev, B. Sapaev, D. Abdullaev, J. Abdullayev, A. Umarov, R. Siddikov, A. Mamasoliev, and K. Daliev, Influence of the parameters to transition capacitance at NCDS-PSI heterostructure, E3S Web of Conferences, vol. 383, no. 04022, pp. 1–7, Apr. 2023. (https://doi.org/10.1051/e3sconf/202338304022).
R. Bebitov, O. Abdulkhaev, D. Yodgorova, D. Istamov, G. Khamdamov, Sh. Kuliyev, J. Sh. Abdullaev, A. Khakimov, and A. Rakhmatov, Potential distribution over temperature sensors of p-n junction diodes with arbitrary doping of the base region, E3S Web Conf. 401, 03062 (2023). (https://doi.org/10.1051/e3sconf/202340103062).